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High-resolution direct-write patterning using focused ion beams
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- Journal:
- MRS Bulletin / Volume 39 / Issue 4 / April 2014
- Published online by Cambridge University Press:
- 09 April 2014, pp. 336-341
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- April 2014
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Novel nanosample preparation with a helium ion microscope
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- Journal:
- Journal of Materials Research / Volume 28 / Issue 8 / 28 April 2013
- Published online by Cambridge University Press:
- 03 April 2013, pp. 1013-1020
- Print publication:
- 28 April 2013
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Application of the Helium Ion Microscope as a Sculpting Tool for Nanosamples
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1455 / 2012
- Published online by Cambridge University Press:
- 31 July 2012, mrss12-1455-ii10-01
- Print publication:
- 2012
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A Design-of-Experiments Approach to Characterizing Beam-Induced Deposition in the Helium Ion Microscope
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- Journal:
- Microscopy Today / Volume 19 / Issue 3 / May 2011
- Published online by Cambridge University Press:
- 28 April 2011, pp. 22-26
- Print publication:
- May 2011
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Nano-engineering with a focused helium ion beam
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1354 / 2011
- Published online by Cambridge University Press:
- 13 September 2011, mrss11-1354-ii03-03
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- 2011
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Electrostatic Aberration Correction in Low-Voltage SEM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 24-25
- Print publication:
- September 2003
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